𝔖 Bobbio Scriptorium
✦   LIBER   ✦

High resolution depth profiling of light elements

✍ Scribed by G. Dollinger; T. Faestermann; P. Maier-Komor


Book ID
113282970
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
581 KB
Volume
64
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


High-depth-resolution Auger depth profil
✍ M Menyhard πŸ“‚ Article πŸ“… 1999 πŸ› Elsevier Science 🌐 English βš– 254 KB

The ion-bombardment-induced defects and their effect on the capability of Auger depth profiling is reviewed and discussed. It is shown that by using low ion energy ( Ͻ 1 keV) and grazing angle of incidence ( Ͼ 80Њ), the quasi-quantitative detection of layers with thickness of 1 nm can be acheived. W

Depth profiling of light elements in mat
πŸ“‚ Article πŸ“… 1978 πŸ› Elsevier Science 🌐 English βš– 175 KB

Classified abstracts 3356-3363 flood gun capable of removing the charge shifts from the passivation (insulator) layers. The study demonstrates the feasibility of ESCA as a tool for industrial metallurgical problems. T L Parr, J Vuc Sci Technol, 14 (l), 1977,664L665. Morphologies of Pt catalyst surf