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High resolution depth profiling of light elements in high atomic mass materials

✍ Scribed by J.P. Thomas; M. Fallavier; D. Ramdane; N. Chevarier; A. Chevarier

Publisher: Elsevier Science
Year: 1983
Weight: 298 KB
Volume: 218
Category: Article
ISSN: 0167-5087
DOI: 10.1016/0167-5087(83)90967-5

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