High Resolution Determination of the Ge Depth Profile in SiGe Heterobipolar Transistor Structures by X-Ray Diffractometry

Determination of the Electron Density Di

Determination of the Electron Density Distribution in the Bonds of a Fullerene Derivative by High-Resolution X-Ray Structure Analysis

✍ Hermann Irngartinger; Anton Weber; Thomas Oeser 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 148 KB 👁 1 views

Bent bonds in the strained fullerene system, restricted to the [5,6] bonds, were detected by high-resolution X-ray structure analysis of the 1,2-dihydro[60]fullerene derivative 1. In addition the maxima of electron densities are higher in the [6,6] bonds than in the [5,6] bonds-an important finding