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ToF-SIMS and XPS characterisation of urban aerosols for pollution studies

✍ Scribed by P. Lazzeri; G. Clauser; E. Iacob; A. Lui; G. Tonidandel; M. Anderle

Book ID
108417878
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
237 KB
Volume
203-204
Category
Article
ISSN
0169-4332

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The combination of time-of-Γ‘ight secondary mass spectrometry (ToF-SIMS) and monochromatized x-ray photoelectron spectroscopy (XPS) has proved to be a valuable tool for the analysis of chemically modiÐed polymer surfaces. By applying these techniques in situ, together with a plasma modiÐcation chambe