The combination of time-of-Γight secondary mass spectrometry (ToF-SIMS) and monochromatized x-ray photoelectron spectroscopy (XPS) has proved to be a valuable tool for the analysis of chemically modiΓed polymer surfaces. By applying these techniques in situ, together with a plasma modiΓcation chambe
ToF-SIMS and XPS study of sulphur on carbon black surface
β Scribed by C. Poleunis; X. Vanden Eynde; E. Grivei; H. Smet; N. Probst; P. Bertrand
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 85 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0142-2421
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