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Application of XPS and ToF-SIMS for surface chemical analysis of DNA microarrays and their substrates

✍ Scribed by Nora Graf; Thomas Gross; Thomas Wirth; Wilfried Weigel; Wolfgang E. S. Unger

Publisher: Springer
Year: 2009
Tongue: English
Weight: 386 KB
Volume: 393
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s00216-009-2599-x

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