TOF SIMS and XPS study of the interaction of silanized E-glass with epoxy resin
β Scribed by D. Wang; F. R. Jones
- Book ID
- 105111586
- Publisher
- Springer
- Year
- 1993
- Tongue
- English
- Weight
- 721 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0022-2461
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Time of flight secondary ion mass spectrometry (ToF-SIMS) has been employed for the study of the adsorption of epoxy resin molecules, diglycidyl ether of bisphenol A (DGEBA), on aluminium substrates treated with an organosilane, g-glycidoxypropyltrimethoxysilane (GPS). Both the kinetics of adsorptio
The surface chemistry of an alkaline-earth boroaluminosilicate glass is changed by contact with chemical solutions. The present study shows that RCA cleaning creates a silica-rich surface on the glass. This altered surface can be removed by hydroΓuoric acid etching. During the RCA cleaning process,