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Threshold voltage dependence of LOCOS-isolated thin-film SOI NMOSFET on buried oxide thickness

โœ Scribed by Jong-wook Lee; Hyung-ki Kim; Min-rok Oh; Yo-hwan Koh


Book ID
126627313
Publisher
IEEE
Year
1999
Tongue
English
Weight
49 KB
Volume
20
Category
Article
ISSN
0741-3106

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