Modeling of edge threshold voltage of mesa-isolated n-channel MOSFETs on fully-depleted thin film SOI

✍ Scribed by Jae-Woo Park; Chul-Hi Han; Choong-Ki Kim

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 236 KB
• Volume: 37
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(94)90206-2