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Substrate impact on threshold voltage and subthreshold slope of sub-32 nm ultra thin SOI MOSFETs with thin buried oxide and undoped channel

✍ Scribed by S. Burignat; D. Flandre; M.K. Md Arshad; V. Kilchytska; F. Andrieu; O. Faynot; J.-P. Raskin


Book ID
108271772
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
981 KB
Volume
54
Category
Article
ISSN
0038-1101

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