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Thin fluorinated gate dielectrics grown by rapid thermal processing in O2 with diluted NF3

โœ Scribed by Lo, G.Q.; Ting, W.; Ahn, J.H.; Kwong, D.-L.; Kuehne, J.


Book ID
114534416
Publisher
IEEE
Year
1992
Tongue
English
Weight
668 KB
Volume
39
Category
Article
ISSN
0018-9383

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