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Thickness measurement of silicon dioxide layers by ultraviolet-visible interference method

✍ Scribed by Edwin A. Corl; Hans Wimpfheimer

Publisher: Elsevier Science
Year: 1964
Tongue: English
Weight: 498 KB
Volume: 7
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(64)90033-4

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