✦ LIBER ✦
73. Thickness measurement by ultraviolet visible interference method of silicon dioxide layers deposited on polished silicon wafers: E A Core and H Wimpfheimer, Solid State Electronics, 7 (10), Oct 1964, 750–761
- Publisher
- Elsevier Science
- Year
- 1965
- Tongue
- English
- Weight
- 140 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0042-207X
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