✦ LIBER ✦
Measuring the thickness of very thin layers by X-ray interference : G. Blet. Rev. Tech. Thomson-CSF3, No. 1, March (1971), p. 111. (In French.)
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 112 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0026-2714
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