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Thickness dependent residual stress in sputtered AlN thin films

✍ Scribed by Paulius Pobedinskas; Jean-Christophe Bolsée; Wim Dexters; Bart Ruttens; Vincent Mortet; Jan D'Haen; Jean V. Manca; Ken Haenen


Book ID
118501920
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
872 KB
Volume
522
Category
Article
ISSN
0040-6090

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