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Thermal stability of MISFET with low-temp molecular-beam epitaxy-grown GaAs and Al0.3Ga0.7As gate ins

✍ Scribed by Rao, R.V.V.V.J.; Chong, T.C.; Tan, L.S.; Lau, W.S.


Book ID
114555850
Publisher
IEEE
Year
2000
Tongue
English
Weight
110 KB
Volume
49
Category
Article
ISSN
0018-9529

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