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Study of grown-in defects and effect of thermal annealing in Al0.3Ga0.7As and GaAs LPE layers

✍ Scribed by Sheng S. Li; C. Y. Lin; S. M. Bedair; J. A. Hutchby


Book ID
112814501
Publisher
Springer US
Year
1982
Tongue
English
Weight
477 KB
Volume
11
Category
Article
ISSN
0361-5235

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