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Thermal instability of copper gate AlGaN/GaN HEMT on Si substrate

✍ Scribed by Park, J.; Lee, K.; Cha, H.-Y.; Seo, K.

Book ID: 121473215
Publisher: The Institution of Electrical Engineers
Year: 2010
Tongue: English
Weight: 149 KB
Volume: 46
Category: Article
ISSN: 0013-5194
DOI: 10.1049/el.2010.1485

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