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Theory of non-steady-state interfacial thermal currents in MOS devices, and the direct determination of interfacial trap parameters

✍ Scribed by J.G. Simmons; G.W. Taylor

Book ID: 107856090
Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 464 KB
Volume: 17
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(74)90060-4

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