𝔖 Bobbio Scriptorium

✦ LIBER ✦

Theory of transient emission current in MOS devices and the direct determination interface trap parameters

✍ Scribed by J.G. Simmons; L.S. Wei

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 614 KB
Volume: 17
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(74)90059-8

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Theory of transient emission current in

Theory of transient emission current in MOS devices and the direct determination interface trap parameters : J. G. Simmons and L. S. Wei. Solid St. Electron. 17 117 (1974)

📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 125 KB

Theory of non-steady-state interfacial t

Theory of non-steady-state interfacial thermal currents in MOS devices, and the direct determination of interfacia; trap parameters : J. G. Simmons and G. W. Taylor. Solid St. Electron. 17, 125 (1974)

📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 117 KB