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Theory of non-steady-state interfacial thermal currents in MOS devices, and the direct determination of interfacia; trap parameters : J. G. Simmons and G. W. Taylor. Solid St. Electron. 17, 125 (1974)

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 117 KB
Volume: 13
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(74)90069-9

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Determination of the energy distribution

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