Theory of transient emission current in MOS devices and the direct determination interface trap parameters : J. G. Simmons and L. S. Wei. Solid St. Electron. 17 117 (1974)

• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 125 KB
• Volume: 13
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(74)90283-2