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Trapping, emission and generation in MNOS memory devices : L. S. Wei and J. G. Simmons. Solid St. Electron. 17, 591 (1974)

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 122 KB
Volume: 13
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(74)90059-6

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