Effects of bulk trapping on the memory characteristics of thick-oxide MNOS variable-threshold capacitors : G. W. Taylor and J. G. Simmons. Solid St. Electron.17, 1 (1974)

• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 221 KB
• Volume: 13
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(74)90509-5