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The use of focused ion beams for analysis

✍ Scribed by J.A. Cookson; F.D. Pilling

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 574 KB
Volume: 19
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(73)90074-6

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