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Transverse Optical Diagnostics for Intense Focused Heavy Ion Beams

โœ Scribed by D. Varentsov; A. D. Fertman; V. I. Turtikov; A. Ulrich; J. Wieser; V. E. Fortov; A. A. Golubev; D. H. H. Hoffmann; A. Hug; M. Kulish; V. Mintsev; P. A. Ni; D. Nikolaev; B. Yu. Sharkov; N. Shilkin; V. Ya. Ternovoi; S. Udrea

Publisher
John Wiley and Sons
Year
2008
Tongue
English
Weight
241 KB
Volume
48
Category
Article
ISSN
0005-8025

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โœ H. Shichi; S. Osabe; K. Kanehori ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 157 KB ๐Ÿ‘ 2 views

A new focused ion beam optical system that uses a liquid metal ion source was designed for a new secondary ion time-of-flight mass spectrometry instrument. This optical system consists mainly of two electrostatic lenses. The axial performance of the system was calculated to decide the design values