𝔖 Bobbio Scriptorium
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Modeling effects of focused ion beams

✍ Scribed by F Stern; S.E Laux; A Kumar


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
292 KB
Volume
40
Category
Article
ISSN
0038-1101

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## Abstract Focused ion beam and dual platform systems have, over the last 10 years, become a main stay of sample preparation for material analysis. In this article the merits of using these systems are discussed and the three main techniques used to prepare cross‐section specimens for transmission