Focused ion beams techniques for nanomaterials characterization

✍ Scribed by Richard M. Langford

• Publisher: John Wiley and Sons
• Year: 2006
• Tongue: English
• Weight: 483 KB
• Volume: 69
• Category: Article
• ISSN: 1059-910X
• DOI: 10.1002/jemt.20324

✦ Synopsis

Abstract

Focused ion beam and dual platform systems have, over the last 10 years, become a main stay of sample preparation for material analysis. In this article the merits of using these systems are discussed and the three main techniques used to prepare cross‐section specimens for transmission electron microscopy (TEM) are both discussed and compared with emphasis being placed on the tricks that users do to make the lamellae as thin as possible and with a minimum of damage at their sidewalls. Other techniques such as serial slicing for three‐dimensional reconstruction and the preparation of plan‐view specimens are also summarized. Microsc. Res. Tech., 2006. © 2006 Wiley‐Liss, Inc.