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The refractive index of InP and its oxide measured by multiple-angle incident ellipsometry

✍ Scribed by Tien Sheng Chao; Chung Len Lee; Tan Fu Lei

Book ID
104848703
Publisher
Springer
Year
1993
Tongue
English
Weight
207 KB
Volume
12
Category
Article
ISSN
0261-8028

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Applicability of multiple angle of incid
Applicability of multiple angle of incidence ellipsometry (MAI). Measurements to GaAs anodic oxide and GaP anodic oxide systems at the wavelength 632.8 nm
✍ Dr. K. LΓΆschke; Dipl.-Math. J. Baumgarten πŸ“‚ Article πŸ“… 1978 πŸ› John Wiley and Sons 🌐 English βš– 491 KB

## Applicability of Multiple Angle of Incidence Ellipsometry (MAI). Measurements to GaAs Anodic Oxide and GaP Anodic Oxide Systems at the Wavelength 632.8 nm Usefulness of MA1 in practical studies of unknown optical systems is controversial in literature. I n the present paper i t is shown that th