Simple and direct determination of complex refractive index and thickness of unsupported or embedded thin films by combined reflection and transmission ellipsometry at 45° angle of incidence

✍ Scribed by Azzam, R. M. A.

• Book ID: 115385672
• Publisher: Optical Society of America
• Year: 1983
• Weight: 359 KB
• Volume: 73
• Category: Article
• ISSN: 0030-3941
• DOI: 10.1364/JOSA.73.001080