𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Determination of complex refractive index and thickness of a homogeneous layer by combined reflection and transmission ellipsometry

✍ Scribed by Lekner, John

Book ID
115387306
Publisher
Optical Society of America
Year
1994
Tongue
English
Weight
295 KB
Volume
11
Category
Article
ISSN
1084-7529

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Determination of complex permittivity an
Determination of complex permittivity and thickness of a single-layer material using reflection ellipsometry at several angles of incidence
✍ F. Sagnard πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 136 KB

## Abstract An analytic formulation is proposed to obtain both complex permittivity and thickness of a single‐layer material from reflection ellipsometry data obtained at more than two angles of incidence. The principle consists in decoupling the equations that involve both thickness and complex pe