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Determination of refractive-index profiles by a combination of visible and infrared ellipsometry measurements

✍ Scribed by Van, V. Nguyen ;Brunet-Bruneau, A. ;Fisson, S. ;Frigerio, J. M. ;Vuye, G. ;Wang, Y. ;Abelès, F. ;Rivory, J. ;Berger, M. ;Chaton, P.

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