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The performance and negative bias illumination stability of Hf-In-Zn-O thin film transistors on sputtering conditions

✍ Scribed by Kim, Hyun-Suk; Park, Jin-Seong


Book ID
121598157
Publisher
Springer US
Year
2013
Tongue
English
Weight
306 KB
Volume
32
Category
Article
ISSN
1385-3449

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