The influence of SiO[sub x] and SiN[sub x] passivation on the negative bias stability of Hf–In–Zn–O thin film transistors under illumination

✍ Scribed by Park, Joon Seok; Kim, Tae Sang; Son, Kyoung Seok; Lee, Kwang-Hee; Maeng, Wan-Joo; Kim, Hyun-Suk; Kim, Eok Su; Park, Kyung-Bae; Seon, Jong-Baek; Choi, Woong; Ryu, Myung Kwan; Lee, Sang Yoon

• Book ID: 125886187
• Publisher: American Institute of Physics
• Year: 2010
• Tongue: English
• Weight: 525 KB
• Volume: 96
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3435482