✦ LIBER ✦
P-141L: Late-News Poster: Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors
✍ Scribed by Hyun Kwang Jeong; Inseok Hur; Woojoon Kim; Jaehyeong Kim; Dongsik Kong; Yongsik Kim; Minkyung Bae; Sunwoong Choi; Dong Myong Kim; Dae Hwan Kim; Keum-Dong Jung; Mun-Soo Park; Moon-Hyun Yoo
- Book ID
- 115558250
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 2012
- Weight
- 642 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0003-966X
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