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The leakage currents of amorphous silicon thin-film transistors: injection currents, back channel currents and stress effects

✍ Scribed by Lemmi, F.; Street, R.A.

Book ID: 114538481
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 105 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.887029

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