๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Dynamic characteristics of leakage current in amorphous silicon thin-film transistors

โœ Scribed by Tomonobu Motai; Kouhei Suzuki; Kouji Suzuki


Book ID
112078826
Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
388 KB
Volume
76
Category
Article
ISSN
8756-663X

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES