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Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors

✍ Scribed by N.A. Hastas; N. Archontas; C.A. Dimitriadis; G. Kamarinos; T. Nikolaidis; N. Georgoulas; A. Thanailakis

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 323 KB
Volume: 45
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2004.06.004

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