Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors

✍ Scribed by V. Davidović; D.N. Kouvatsos; N. Stojadinović; A.T. Voutsas

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 371 KB
• Volume: 47
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2007.07.025