𝔖 Bobbio Scriptorium
✦   LIBER   ✦

The kinetics of a surface-chemical reaction: A time-of-flight secondary ion mass spectrometry study

✍ Scribed by P.N.T. van Velzen; J.J. Ponjeé; A. Benninghoven


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
673 KB
Volume
37
Category
Article
ISSN
0169-4332

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


A New Focused Ion Beam Optical System fo
✍ H. Shichi; S. Osabe; K. Kanehori 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 157 KB 👁 2 views

A new focused ion beam optical system that uses a liquid metal ion source was designed for a new secondary ion time-of-flight mass spectrometry instrument. This optical system consists mainly of two electrostatic lenses. The axial performance of the system was calculated to decide the design values

Time-of-flight static secondary ion mass
✍ Bibhash R. Chakraborty; Daniel E. Lehman; Nicholas Winograd 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 193 KB 👁 2 views

Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to characterize surface contaminants on a Pt-10% Ir alloy sample prescribed for fabrication of a prototype kilogram mass standard. The identification of various oxygenated and non-oxygenated hydrocarbon adsorbates on the