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Time-of-flight static secondary ion mass spectrometry analysis of surface contamination on Pt/Ir standard mass material

✍ Scribed by Bibhash R. Chakraborty; Daniel E. Lehman; Nicholas Winograd

Publisher: John Wiley and Sons
Year: 1998
Tongue: English
Weight: 193 KB
Volume: 12
Category: Article
ISSN: 0951-4198
DOI: 10.1002/(sici)1097-0231(19980930)12:18<1261::aid-rcm322>3.0.co;2-#

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✦ Synopsis

Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to characterize surface contaminants on a Pt-10% Ir alloy sample prescribed for fabrication of a prototype kilogram mass standard. The identification of various oxygenated and non-oxygenated hydrocarbon adsorbates on the Pt-Ir surface provides a scenario for the increase in mass observed after standard cleaning procedures, and as a function of time. Static TOF-SIMS analysis suggests the catalytic activity of Pt plays a key role in the adsorption of organic solvents used in standard cleaning procedures as well as adsorption of hydrocarbon species present in ambient laboratory air.

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