✦ LIBER ✦

Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy

✍ Scribed by Henneuse-Boxus, Catherine; Poleunis, Claude; De Ro, Astrid; Adriaensen, Yasmine; Bertrand, Patrick; Marchand-Brynaert, Jacqueline

Publisher: John Wiley and Sons
Year: 1999
Tongue: English
Weight: 279 KB
Volume: 27
Category: Article
ISSN: 0142-2421
DOI: 10.1002/(sici)1096-9918(199903)27:3<142::aid-sia493>3.0.co;2-6

No coin nor oath required. For personal study only.

✦ Synopsis

Using the wet chemistry method, the surface of poly(aryl ether ether ketone) (PEEK) Ðlm was selectively modiÐed to produce PEEK-OH, PEEK-COOH, PEEK-glutamine, and samples displaying, PEEK-NH 2 PEEK-SO 3 H respectively, hydroxyl, carboxyl, amino acid, amine and sulphonyl functions. All the samples were analysed by XPS and time-of-Ñight (ToF) SIMS ; the experimental data provided by both techniques were in good agreement, and allowed the chemical nature and the yield of the functional groups introduced by the di †erent surface derivatizations to be determined.

📜 SIMILAR VOLUMES

Characterization of adsorbed protein fil

Characterization of adsorbed protein films by time of flight secondary ion mass spectrometry

✍ Lhoest, J.-B. ;Wagner, M. S. ;Tidwell, C. D. ;Castner, David G. 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 254 KB 👁 1 views

Stereoregular polypropylenes studied by

Stereoregular polypropylenes studied by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and atomic force microscopy (AFM)

✍ Xu, Keyang; Gusev, Arkady I.; Hercules, David M. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 424 KB 👁 1 views

Time-of-Ñight secondary ion mass spectrometry (ToF-SIMS) and atomic force microscopy (AFM) were utilized to characterize polypropylenes of di †erent stereoregularity (atactic, syndiotactic and isotactic) deposited on gold-or silver-coated mica surfaces. The AFM images clearly revealed distinctive su

Compatibilization of polycarbonate and p

Compatibilization of polycarbonate and poly(vinylidene fluoride) blends studied by time-of-flight secondary ion mass spectrometry and scanning electron microscopy

✍ Feng, Jiyun; Weng, Lu-Tao; Li, Lin; Chan, Chi-Ming 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 483 KB 👁 1 views

The compatibilization of polycarbonate (PC) and poly(vinylidene fluoride) (PVDF) by poly(methyl methacrylate) (PMMA) was elucidated in detail using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and scanning electron microscopy (SEM). Special PC/(PMMA/PVDF) sandwich-like samples were prep

Characterization of the surface organiza

Characterization of the surface organization of nanostructured hybrid organic–inorganic materials by time-of-flight secondary ion mass spectrometry

✍ Geneviève Cerveau; Robert J. P. Corriu; Josiane Dabosi; Cédric Fischmeister-Lepe 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 134 KB 👁 2 views

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to analyse the surface composition of organic-inorganic hybrid solids obtained by a sol-gel process. Gels of type O 1.5 Si-R-SiO 1.5 , obtained from bis-silylated precursors (R'O) 3 -R-Si(OR') 3 (R' = Me, Et and R = (-CH 2 ) n -