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Measurement of Insulator Surface Potential Using Time-of-flight Secondary Ion Mass Spectrometry

✍ Scribed by X. Q. Guo; R. T. Short

Publisher: John Wiley and Sons
Year: 1996
Tongue: English
Weight: 533 KB
Volume: 10
Category: Article
ISSN: 0951-4198
DOI: 10.1002/(sici)1097-0231(199602)10:3<372::aid-rcm484>3.0.co;2-2

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