๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Imaging time-of-flight secondary ion mass spectrometry of solid-phase peptide syntheses

โœ Scribed by Aubagnac, J.-L.; Enjalbal, C.; Drouot, C.; Combarieu, R.; Martinez, J.


Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
430 KB
Volume
34
Category
Article
ISSN
1076-5174

No coin nor oath required. For personal study only.

โœฆ Synopsis


Imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) of solid-phase peptide syntheses carried out by the Merrifield and Sheppard strategies is described. Mixtures of resin beads mixed at random from batch syntheses or obtained in combinatorial chemistry by the mix and split technique, where each bead is functionalized by a unique peptide, were analyzed directly without any chemical cleavage of the growing chains to assess the nature of the growing structure on any bead of the mixture without its isolation.


๐Ÿ“œ SIMILAR VOLUMES


Application of time-of-flight secondary
โœ Aubagnac, J.-L.; Enjalbal, C.; Subra, G.; Bray, A. M.; Combarieu, R.; Martinez, ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 170 KB ๐Ÿ‘ 2 views

In the rapidly growing รeld of combinatorial chemistry, the Multipin approach has been used for rapid and efficient multiple parallel syntheses of organic compounds. This strategy is particularly well adapted for the optimization of reaction conditions prior to chemical library syntheses, for the pr

Characterization of combinatorially desi
โœ Anna M. Belu; Stephen Brocchini; Joachim Kohn; Buddy D. Ratner ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 114 KB ๐Ÿ‘ 2 views

A series of 16 polyarylates, with well-controlled and systematically varying chemistry, has been characterized by time-of-flight secondary ion mass spectrometry (TOF-SIMS). The polymers are structurally identical except for the incremental additions of C 2 H 4 units to the backbone and sidechain. Fr

Time-of-flight secondary ion mass spectr
โœ C. Enjalbal; J. Martinez; G. Subra; R. Combarieu; J.-L. Aubagnac ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 97 KB ๐Ÿ‘ 1 views

The TOF-SIMS (time-of-flight-secondary ion mass spectrometry) spectra of Fmoc-amino acids linked to solid supports through ionic interactions have been studied to examine if easy desorption of preformed ions from the surface occurred. Preliminary results indicated that the structure of the polymer a

Time-of-flight static secondary ion mass
โœ Bibhash R. Chakraborty; Daniel E. Lehman; Nicholas Winograd ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 193 KB ๐Ÿ‘ 1 views

Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to characterize surface contaminants on a Pt-10% Ir alloy sample prescribed for fabrication of a prototype kilogram mass standard. The identification of various oxygenated and non-oxygenated hydrocarbon adsorbates on the