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Characterization of combinatorially designed polyarylates by time-of-flight secondary ion mass spectrometry

✍ Scribed by Anna M. Belu; Stephen Brocchini; Joachim Kohn; Buddy D. Ratner


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
114 KB
Volume
14
Category
Article
ISSN
0951-4198

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✦ Synopsis


A series of 16 polyarylates, with well-controlled and systematically varying chemistry, has been characterized by time-of-flight secondary ion mass spectrometry (TOF-SIMS). The polymers are structurally identical except for the incremental additions of C 2 H 4 units to the backbone and sidechain. From the spectra, peaks characteristic of all polyarylates are identified. Furthermore, evaluation of the spectra and identification of unique signals allow classification of the polyarylates according to sidechain and backbone chemistry.


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