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Investigation of the postcure reaction and surface energy of epoxy resins using time-of-flight secondary ion mass spectrometry and contact-angle measurements

✍ Scribed by Firas Awaja; Michael Gilbert; Bronwyn Fox; Georgina Kelly; Paul J. Pigram


Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
824 KB
Volume
113
Category
Article
ISSN
0021-8995

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to analyse the surface composition of organic-inorganic hybrid solids obtained by a sol-gel process. Gels of type O 1.5 Si-R-SiO 1.5 , obtained from bis-silylated precursors (R'O) 3 -R-Si(OR') 3 (R' = Me, Et and R = (-CH 2 ) n -