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The influence of implantation temperature and subsequent annealing on residual implantation defects in silicon

✍ Scribed by P. Hazdra; V. Has̆lar; M. Bartos̆


Book ID
113282456
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
464 KB
Volume
55
Category
Article
ISSN
0168-583X

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