๐”– Bobbio Scriptorium
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The influence of dose and protecting mask on electrically active defects induced by ion implantation in silicon

โœ Scribed by B. Remaki; J. J. Marchand; B. Balland


Book ID
112814931
Publisher
Springer US
Year
1989
Tongue
English
Weight
455 KB
Volume
18
Category
Article
ISSN
0361-5235

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