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Redistribution and electrical activation of implanted arsenic in silicon on insulator substrates formed by oxygen ion implantation

โœ Scribed by Robinson, A. K.; Reeson, K. J.; Hemment, P. L. F.


Book ID
120618140
Publisher
American Institute of Physics
Year
1990
Tongue
English
Weight
553 KB
Volume
68
Category
Article
ISSN
0021-8979

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Arsenic ions were implanted into silicon-on-insulator (SOl) structures at an incident energy of 100 keV to a dose of 2 x 10 lscm-z. Conductive top layers were formed in the SOl structures after annealing at 1200 ~ for 20 s. Infrared reflection spectra in the wave number range of 1500-5000 cm -1 were