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The impact of uniaxial stress on subband structure and mobility of strain Si NMOSFETs

✍ Scribed by S.T. Chang; S.H. Liao; C.-Y. Lin


Book ID
108290187
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
222 KB
Volume
517
Category
Article
ISSN
0040-6090

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